Dataset: Alkali Ion diffusion and structure of chemically strengthened TiO2 doped soda-lime silicate glass
Dataset: Alkali jon diffusion och struktur för kemiskt härdade TiO2 dopade soda kalk silikatglas
Diffusion kinetics and structural properties of chemically strengthened titania-doped soda-lime silicate glasses were studied by depth-resolved X-ray photoelectron spectroscopy, Raman spectroscopy and spectrophotometry.
Chemical strengthening (CS) is frequently used to strengthen thin glasses. CS of glass is based on ion exchange of larger ions from a molten salt into glass. Both the ion and counter ion are conventionally monovalent alkali ions.
Diffusion kinetics and structural properties of chemically strengthened titania-doped (TiO2) soda-lime silicate (SLS) glasses were studied by depth-resolved X-ray photoelectron spectroscopy, Raman spectroscopy and spectrophotometry. The glasses were ion exchanged, whereby Na+ in the glass was replaced by K+ in a molten salt bath, at four different treatment temperatures between 350 and 500 °C.
The following samples were prepared and analyzed by X-ray Photoelectron Spectroscopy (XPS): (1) SLS, (2) 4.7% TiO2, and (3) 9.9% TiO2. The ion exchange procedure was performed for 5 h at four different temperatures below Tg (350, 400, 450 and 500 °C). Before XPS measurements, the samples were wet-etched using hydrofluoric (HF) acid to produce samples with six different etching depths.
The Raman scattered light was detected in the backscattering configuration employing linear polarization and 2400 lines/mm grating, and a 100x objective lens. Depth profile spectra were collected at six different depths of 0, 10, 20, 30, 40, and 50 µm for each glass sample, employing 12 scans with a 10 s exposure time for each scan.
Spectrophotometric measurements were conducted before and after K+/Na+ ion-exchange treatmeatment for 5 h at 500 °C, collected between 300 and 2500 nm.
File List:
XPS:
XPS_4.7%TiO2_350degrees_acq1.txt
XPS_4.7%TiO2_350degrees_acq2.txt
XPS_4.7%TiO2_400degrees_acq1.txt
XPS_4.7%TiO2_400degrees_acq2.txt
XPS_4.7%TiO2_450degrees_acq1.txt
XPS_4.7%TiO2_450degrees_acq2.txt
XPS_4.7%TiO2_500degrees_acq1.txt
XPS_4.7%TiO2_500degrees_acq2.txt
XPS_4.7%TiO2_500degrees_acq3.txt
XPS_4.7%TiO2_500degrees_acq4.txt
XPS_9.9%TiO2_350degrees_acq1.txt
XPS_9.9%TiO2_350degrees_acq2.txt
XPS_9.9%TiO2_400degrees_acq1.txt
XPS_9.9%TiO2_450degrees_acq1.txt
XPS_9.9%TiO2_450degrees_acq2.txt
XPS_9.9%TiO2_450degrees_acq3.txt
XPS_9.9%TiO2_500degrees_acq1.txt
XPS_9.9%TiO2_500degrees_acq2.txt
XPS_9.9%TiO2_500degrees_acq3.txt
Variable 1: KE_Ti 2p 8, Description: Kinetic Energy, Unit: eV
Variable 2: BE_Ti 2p 8, Description: Binding Energy, Unit: eV
Variable 3: CPS_Ti 2p 8, Description: Ti XPS specta, Unit: Counts per s
Variable 4: Ti 2p_1_Ti_2p 8, Description: Ti4+ 2p3/2 deconvolution, Unit: Counts per s
Variable 5: Ti 2p_2_Ti 2p 8, Description: Ti4+ 2p1/2 deconvolution, Unit: Counts per s
Variable 6: Ti 2p_3_Ti 2p 8, Description: Ti3+ 2p1/2 deconvolution, Unit: Counts per s
Variable 7: Ti 2p_4_Ti 2p 8, Description: Ti3+ 2p3/2 deconvolution, Unit: Counts per s
Variable 8: Background_Ti 2p 8, Description: Background spectra, Unit: Counts per s
Variable 9: Envelope_Ti 2p 8, Description: Sum of the deconvolutions and background, Unit: Counts per s
Variable 10: Normalised_Residual_Ti 2p 8, Description: Normalised residual spectra, Unit: Counts per s
Variable 11: Residual_Ti 2p 8, Description: Residual spectra, Unit: Counts per s
Raman spectroscopy:
Raman_SLS_untreated_depth1.txt
Raman_SLS_500deg_depth6.txt
Raman_SLS_500deg_depth5.txt
Raman_SLS_500deg_depth4.txt
Raman_SLS_500deg_depth3.txt
Raman_SLS_500deg_depth2.txt
Raman_SLS_500deg_depth1.txt
Raman_SLS_450deg_depth1.txt
Raman_SLS_400deg_depth1.txt
Raman_SLS_350deg_depth1.txt
Raman_4.7%TiO2_untreated_depth1.txt
Raman_4.7%TiO2_500deg_depth6.txt
Raman_4.7%TiO2_500deg_depth5.txt
Raman_4.7%TiO2_500deg_depth4.txt
Raman_4.7%TiO2_500deg_depth3.txt
Raman_4.7%TiO2_500deg_depth2.txt
Raman_4.7%TiO2_500deg_depth1.txt
Raman_4.7%TiO2_450deg_depth1.txt
Raman_4.7%TiO2_400deg_depth1.txt
Raman_4.7%TiO2_350deg_depth1.txt
Raman_9.9%TiO2_untreated_depth1.txt
Raman_9.9%TiO2_500deg _depth6.txt
Raman_9.9%TiO2_500deg _depth5.txt
Raman_9.9%TiO2_500deg _depth4.txt
Raman_9.9%TiO2_500deg _depth3.txt
Raman_9.9%TiO2_500deg _depth2.txt
Raman_9.9%TiO2_500deg _depth1.txt
Raman_9.9%TiO2_450deg _depth1.txt
Raman_9.9%TiO2_400deg _depth1.txt
Raman_9.9%TiO2_350deg _depth1.txt
Variable 1: #Wave, Description: Wavelength, Unit: cm-1
Variable 2: #Intensity, Description: Raman intensity, Unit: Counts per s
Spectrophotometry:
SLS_AbsorptionCoefficient_untreated.txt
SLS_ AbsorptionCoefficient_treated.txt
4.7%TiO2_AbsorptionCoefficient_untreated.txt
4.7%TiO2_AAbsorptionCoefficient_treated.txt
9.9%TiO2_AbsorptionCoefficient_untreated.txt
9.9%TiO2_AbsorptionCoefficient_treated.txt
Variable 1: Description: Wavelength, Unit: nm
Variable 2: Description: Absorption coefficient, Unit: cm-1
Diffussionskinetik och strukturella egenskaper för kemiskt härdade titanoxid dopade soda kalk silikat glas studerades med djupupplöst fotoelektronspektroskopi, Ramanspektroskopi och spektrofotometri.
Vänligen se den engelska katalogsidan för utförligare beskrivning.
Se engelska katalogsidan för fillista och varibelförklaringar och se readme-filen för mer utförlig beskrivning.
2022-04-01T06:11:31.875649Z
2022-04-01T06:11:31.875649Z
Felix Bengtsson
Ilknur Bayrak Pehlivan
Lars Österlund
Stefan Karlsson
Materials Chemistry
Materialkemi
Condensed Matter Physics
Den kondenserade materiens fysik
Analytical Chemistry
Analytisk kemi
Other Materials Engineering
Annan materialteknik
Physical Sciences
Fysik
Chemical Sciences
Kemi
Materials Engineering
Materialteknik
Engineering and Technology
Teknik
Natural Sciences
Naturvetenskap
Spectrophotometry
Spektrofotometri
Spectrum Analysis, Raman
Ramanspektroskopi
Photoelectron Spectroscopy
Fotoelektronspektroskopi
diffusion
diffusion
glass
glas
melting
smältning
tempering (metalwork)
härdning
Photometry
Fotometri
Scattering, Radiation
Strålningsspridning
Spectrum Analysis
Spektralanalys
action with an object
aktivitet med objekt
Chemistry Techniques, Analytical
Analytisk kemi, tekniker
Physical Phenomena
Fysiska fenomen
action
verksamhet
Investigative Techniques
Utredningsmetoder
events and action
händelser och handling
RISE Research Institutes of Sweden
RISE Research Institutes of Sweden